VTS 2007 - Call for Participation

CALL FOR PARTICIPATION

LAST CHANCE TO TAKE ADVANTAGE OF DISCOUNTED VTS 2007 ROOM RATES
Room Rates At the Claremont Resort Will Increase After APRIL 13, 2007

ONLINE REGISTRATION IS NOW AVAILABLE AT: https://www.cemamerica.com/vts2007/
Advance Registration Rates End April 23, 2007

IOST3 2007 -- WTW 2007 -- TTEP Tutorials

IOST3 2007

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IEEE INTERNATIONAL WORKSHOP on OPEN SOURCE TEST TECHNOLOGY TOOLS

The IOST3 workshop supports a community of practice focused on open source and open interface tools for test, quality assurance, and reliability estimation of electronic devices, assemblies, and systems.

This year's Workshop will focus on data management – test vector standards, datalogs, validation and analytical tools, and particularly on the aggregation and correlation of data from disparate sources that effective collaboration can provide. Design data for IC's, subassemblies, and systems, failure and repair reports, and production equipment histories all play a role in identifying root causes and improving reliability. The warp and woof of collaboration and competition create the fabric of civilization's progress, and the Open Source milieu has been found to provide a dramatic new means to facilitate that progress. IOST3 is exploring that milieu for the benefit of semiconductor and system test in a worldwide community.

IOST3 Preliminary Schedule Claremont Resort and Spa, Berkeley CA Wednesday, May 9, 2007
4:00 pm	Welcome Burnell West, IOST3 General Chair
4:15 pm	Program Introduction Scott Davidson, Sun Microsystems, Program Chair
4:30 pm	Keynote Address Paul Muray, Sun Microsystems
5:15 pm	Open Discussion
6:15 pm WINE & CHEESE RECEPTION
Thursday, May 10, 2007
7:30 am REGISTRATION & CONTINENTAL BREAKFAST
8:00 am	Session 2: Open Source Information for ICs
8:00 am	Device, Subassembly, and System Data Structures for Test and Reliability B. West
8:30 am	Comparative Mixed-signal Test Method and Toolset A. Mellik, J. Raik - Tallinn University of Technology
9:00 am	Globally Optimized Robust Systems Research:Open Source Tools and Techniques S. Mitra - Stanford Univ.
9:30 am	An Extensible Evolutionary-based General-purpose Optimizer E. Sanchez, M. Schillaci, G. Squillero - Politecnico di Torino
10:00 am BREAK
10:30 am	Session 3: Open Source Standards
10:30 am	STIL Progress and Common STIL Tools T. Taylor
11:00 am	IEEE 1500 Compliant Self-Test Design Library D. Appello - STM; P. Bernardi, M. Grosso, W. Sanchez, M. Sonza Reorda, J Lagos-Benites - Politecnico di Torino
2:00 pm	Standardizing Fail datalog format for Volume Diagnostics Ajay Khoche - Verigy
12:00 noon LUNCH
3:00 pm	Session 4: Managing Data for Quality
1:30 pm	Shared Analysis of system level data speeds diagnosis of ASIC NTFs M. Kamm - Cisco
2:00 pm	Guitar: A Visualization Tool for Returns and Other Information S. Davidson, A. Hale - Sun Microsystems
2:30 pm	Test Technology Collaboration Consortium B. Price - NXP Semiconductors
3:00 pm BREAK
3:30 pm	Wrap-up Discussion

For more information, visit us on the web at: http://iost3.org/

The IOST3 2007: IEEE International Workshop on Open Source Test Technology Tools is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

WTW 2007

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6th IEEE WORKSHOP on TEST of WIRELESS CIRCUITS and SYSTEMS

The Wireless Test Workshop (WTW2007) is an IEEE-sponsored workshop devoted to exploring all issues relating to the design and especially test of wireless circuits and systems. The workshop will be held the day before the VLSI Test Symposium (VTS) 2007.

WTW Advance Technical Program Claremont Resort and Spa, Berkeley CA Sunday, May 6, 2007
7:30 am - 8:30 am REGISTRATION & CONTINENTAL BREAKFAST
8:30 am - 8:45 am	Opening Address: M. Slamani, General Chair R. Aitken, Program Chair
8:45 am - 10:00 am	Session 1: Invited Speaker & RF Test Instruments
8:45 am - 9:30 am	Invited Speaker: Advanced Wireless Technology Connects With The Next Billion Users C. Force - Texas Instruments
9:30 am - 10:00 am	Portable RF Instuments for ATE M. Roos - Roos Instruments
10:00 am - 10:30 am BREAK
10:30 am - 12:00 pm	Session 2: DIGRF 3G Cell Phones Standard
10:30 am - 11:30 am	Mini Tutorial: A DigRF 3G RF/Baseband Interface Standard V. Wilkerson - RFMD
11:30 am - 12:00 pm	Digital Vector Signal Analysis: How to Test Your Digital Baseband/IF Interface, A New Paradigm in Modern Digital Radio Analysis J. Dralla, G. Farber - Agilent Technologies
12:00 pm - 1:00 pm LUNCH
1:00 pm - 2:30 pm	Session 3: WIMAS & Test Challenges
1:00 pm - 1:30 pm	A Technical Overview and Performance Evaluation on Mobile WiMAX F. Cheng - Intel
1:30 pm - 2:00 pm	Managing Complex Impedance, Isolation & Calibration for KGD RF Test R. Hayward, J. Arasmith - Cascade Microtech
2:00 pm - 2:30 pm	Octal Site Production Test of a WLAN RF Transceiver F. Taenzler - Texas Instruments
2:30 pm - 3:00 pm BREAK
3:00 pm - 4:00 pm	Session 4: Test Techniques I
3:00 pm - 3:30 pm	Method of Measuring Frequency in RF/SOC Devices in a Production Test Environment J. Kelly, T. Heistand - Verigy, Inc.; F. Fallah - Qualcomm; J. Sanderson - Agilent Technologies
3:30 pm - 4:00 pm	Characterization of Ground Bounce Effect on Testing the Idle Channel Noise in a CODEC for Mobile Application A. Owzar, E. Baykal, R. Stephan, M. Helfenstein - NXP Semiconductors
4:00 pm - 5:30 pm	Session 5: Test Techniques II
4:00 pm - 4:30 pm	On-Chip High-Speed Signal Sampling for Embedded Test S. Puligundla, J. Ahn, W. R. Eisenstadt - University of Florida
4:30 pm - 5:00 pm	Re-using of Behavioral Level Design Validation Test Bench for Production Testing of AMS and RF SoCs Y. Joannon, V. Beoulle, C. Robach, S. Tedjini - LCIS-ESISAR (INPG); Y. Joannon, J.-L. Carbonero - STMicroelectronics
5:00 pm - 5:30 pm	A Built-in Test-based Reconfiguration Scheme for UWB Receivers for Increased Quality of Service (QoS) R. Senguttuvan, S. Bhattacharya, A. Chatterjee - Georgia Inst. of Technology

For more information, visit us on the web at: http://www.wtw2007.tec.ufl.edu/

The 6th IEEE Workshop on Test of Wireless Circuits and Systems (WTW 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTEP Tutorials at VTS 2007

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IEEE TTTC Test Technology Educational Program
TTEP 2007

VTS 2007: IEEE VLSI Test Symposium 2007 (VTS 07)
May 6-10 2007, Berkeley, California, USA

Registration and tutorials information is available on http://www.tttc-vts.org

Scan Delay Testing of Nanometer SoCs (full-day tutorial)
Adit Singh, Auburn U, USA

DFX: The Convergence of Yield, Manufacturing, and Test (full-day tutorial)
Robert Aitken, ARM, USA

Dealing with Timing Issues for Sub-100n Designs --- From Modeling to Mass Production (full-day tutorial)
Li-C. Wang, University of California, Santa Barbara, USA
Magdy Abadir, Freescale Semiconductor, USA

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For more information on VTS 2007, visit us on the web at: http://www.tttc-vts.org